TinyML
ST arc fault detection models (st_conv, st_dense)
STMicroelectronics models that classify electrical current windows as normal or arc fault. Built for arc fault detection on STM32 microcontrollers.
Levelmodel
ClassTinyML
Parametersnot in the notes
Contextnot in the notes
Releasednot in the notes
Opennessunknown
Runs onmicrocontroller
Statusactive
R&D Topics
Identity
- Developer
- STMicroelectronics
- Family
- not in the notes
- Released
- – sources
- Weights published
- –
- Record checked
- 12 Oct 2026
Where this comes from
Developer and dates from the research notes. Release date is the vendor's public announcement; weights date is when open weights were published.
Architecture and Size
- Architecture
- CNN
- Total parameters
- – sources
- Active parameters
- –
- Checkpoint parameters
- –
- Note
- st_conv is a per-channel CNN (1 or 4 channels, 512-sample windows); st_dense is a fully connected network (1 or 8 channels).
- Context length
- not in the notes
- Input
- sensor
- Output
- labels and boxes
Where this comes from
Parameter counts as the developer states them. Where the checkpoint holds a different total, both are shown (register A16).
Openness and Access
- Openness
- unknown
- Licence
- not in the notes sources
- Access routes
- open weights download
Where this comes from
The licence file governs over registry tags and aggregator labels.
Deployment
- Runs on
- microcontroller
- Footprint
- Benchmarked in the README on the B-U585I-IOT02A board (STM32U5) and STM32N6.
- Runtimes
- not in the notes
Where this comes from
Deployment tiers and runtimes as named in the notes. Footprint is the notes' figure, not a measurement by AURION.
Indonesia
- Indonesian support
- not stated
- Regional languages
- not in the notes
- Jakarta hosting
- unknown
- Languages
- not in the notes
Where this comes from
Indonesia fields are carried on every model; unknown is an allowed value.
Benchmark Results
The notes record no benchmark result for this model.
Lineage
The notes record no lineage for this model.
Industry Use Cases
No industry use case links this model.
Links
ModelST arc fault detection models (st_conv, st_dense)STMicroelectronics, TinyML
ST arc fault detection models (st_conv, st_dense)STMicroelectronics, TinyMLUse CasesAnomaly Detection on Sensor, SCADA and Historian DataIndustrialPharma Manufacturing and GMPHealthcarePredictive Maintenance (Failure Prediction, RUL)IndustrialUse cases of models in the same R&D topic; none is recorded for this model itself.
Who Runs It
PT Kalbe Farma TbkProof of concept, 20 Jul 2026
PT Pertamina Hulu Rokan (PHR)In production, 17 Oct 2025
PT Kilang Pertamina InternasionalIn production, 17 Oct 2025PT Pertamina International Shipping with Pertamina Marine EngineeringPlanned, 9 Dec 2024+10 moreDeployments of these use cases; none names this model.
PT Kalbe Farma TbkProof of concept, 20 Jul 2026PT Pertamina Hulu Rokan (PHR)In production, 17 Oct 2025PT Kilang Pertamina InternasionalIn production, 17 Oct 2025PT Pertamina International Shipping with Pertamina Marine EngineeringPlanned, 9 Dec 2024+10 moreDeployments of these use cases; none names this model.Organisations 1
Sources
- github.com/STMicroelectronics/stm32ai-modelzoo/tree/main... https://github.com/STMicroelectronics/stm32ai-modelzoo/tree/main/arc_fault_detection
- github.com/STMicroelectronics/stm32ai-modelzoo/tree/main... https://github.com/STMicroelectronics/stm32ai-modelzoo/tree/main/arc_fault_detection/st_conv
- github.com/STMicroelectronics/stm32ai-modelzoo/tree/main... https://github.com/STMicroelectronics/stm32ai-modelzoo/tree/main/arc_fault_detection/st_dense
To cite this page: Project AURION, AI Use-Cases Research & Innovation, "ST Arc Fault Detection Models (St_conv, St_dense)", https://aurion.semai.id/models/stmicroelectronics-arc-fault-detection/, records of October 2026.